P. I. Rovira - Concepedia

Author

P. I. Rovira

Pennsylvania State University

Also Known As

P I Rovira, P. I. Rovira, P.I Rovira, P.I. Rovira, Pablo I. Rovira, Pablo Ivan Rovira, Pablo Rovira, Rovira, P.

Publications

1.3K

Citations

H-Index

Concepts

All Affiliations

Pennsylvania State University University of Alberta

About

P. I. Rovira is an author at Pennsylvania State University specializing in applied physics, engineering, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	16	1.1K
2	Applied Physics	15	16	1.1K
3	Natural Sciences	6	6	493
4	Electrical Engineering	2	2	58
5	Education	1	1	40

P. I. Rovira

Publications

1.2K

Citations

H-Index

Page 1

	Year	Citations
Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films Hiroyuki Fujiwara, Joohyun Koh, P. I. Rovira, Physical review. B, Condensed matter Materials ScienceSemiconductor Thin FilmsSurface CharacterizationOne-parameter EmtEngineering	2000	275
Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth Joungchel Lee, P. I. Rovira, Ilsin An, Review of Scientific Instruments Diamond FilmOptical MaterialsEngineeringFluid MechanicsOptical Testing	1998	206
Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silane Joohyun Koh, André S. Ferlauto, P. I. Rovira, Applied Physics Letters Phase DiagramsEngineeringThin Film Process TechnologySilicon On InsulatorHydrogen-diluted Silane	1999	152
Analysis of specular and textured SnO2:F films by high speed four-parameter Stokes vector spectroscopy P. I. Rovira, R. W. Collins Journal of Applied Physics Optical MaterialsEngineeringOptical TestingTextured Sno2Optical Characterization	1999	92
Advances in multichannel spectroscopic ellipsometry R. W. Collins, Ilsin An, Hiroyuki Fujiwara, Thin Solid Films PhysicsOptical PropertiesSpectroscopyNatural SciencesInstrumentation	1998	82
Transmission ellipsometry of a thin-film helicoidal bianisotropic medium P. I. Rovira, R. A. Yarussi, R. W. Collins, Applied Physics Letters Materials ScienceMagnetismEngineeringOptical RotationPhysics	1997	50
Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry R. W. Collins, Joohyun Koh, Hiroyuki Fujiwara, Applied Surface Science Optical MaterialsEngineeringPhysicsOptical PropertiesSpectroscopy	2000	47
Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry R. W. Collins, Joohyun Koh, André S. Ferlauto, Thin Solid Films Materials ScienceReal Time AnalysisEngineeringMicrofabricationSilicon On Insulator	2000	45
Maximization of the open circuit voltage for hydrogenated amorphous silicon n–i–p solar cells by incorporation of protocrystalline silicon <i>p</i>-type layers R.J. Koval, Chi Chen, G.M. Ferreira, Applied Physics Letters EngineeringSolar Cell VocPhotovoltaic DevicesPhotovoltaicsSemiconductor Device	2002	45
Alignment and calibration of the MgF_2 biplate compensator for applications in rotating-compensator multichannel ellipsometry Joungchel Lee, P. I. Rovira, Ilsin An, Journal of the Optical Society of America A Multichannel EllipsometersPhysicsMeasurementCalibrationSpectroscopy	2001	40

Page 1