Joohyun Koh

Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry

R. W. Collins, André S. Ferlauto, G.M. Ferreira et al. · Solar Energy Materials and Solar Cells · 2003 · 329 citations

Natural Sciences, Materials Engineering, Materials Science +14

Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films

Hiroyuki Fujiwara, Joohyun Koh, P. I. Rovira et al. · Physical review. B, Condensed matter · 2000 · 276 citations

Engineering, Materials Engineering, Materials Science +17

Optimization of hydrogenated amorphous silicon <i>p–i–n</i> solar cells with two-step <i>i</i> layers guided by real-time spectroscopic ellipsometry

Joohyun Koh, Yeeheng Lee, Hiroyuki Fujiwara et al. · Applied Physics Letters · 1998 · 225 citations

Natural Sciences, Materials Engineering, Materials Science +17

Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silane

Joohyun Koh, André S. Ferlauto, P. I. Rovira et al. · Applied Physics Letters · 1999 · 152 citations

Natural Sciences, Materials Engineering, Materials Science +17

Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films

R. W. Collins, Joohyun Koh · Journal of the Optical Society of America A · 1999 · 142 citations

Natural Sciences, Materials Science, Optical Materials +15