Concepedia
Microelectronics Reliability · 2010 · 55 citations · 27 references
Materials ScienceMaterials EngineeringElectromigration TechniqueEngineeringMechanical EngineeringInterconnect (Integrated Circuits)High Volume ProductionElectronic PackagingMicroelectronicsWire Arc Additive ManufacturingMicrostructure
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Growth behavior of Cu/Al intermetallic compounds and cracks in copper ball bonds during isothermal aging
C.J. Hang, Chunqing Wang, M. Mayer et al. · Microelectronics Reliability · 2007 · 239 citations
Materials Engineering, Materials Science, Growth Behavior +12
Effects of Cu/Al intermetallic compound (IMC) on copper wire and aluminum pad bondability
Hyoung-Joon Kim, Joo Yeon Lee, Kyung-Wook Paik et al. · IEEE Transactions on Components and Packaging Technologies · 2003 · 220 citations
Engineering, Mechanical Engineering, Copper Wire +16
An analysis of intermetallics formation of gold and copper ball bonding on thermal aging
S. Murali, Narasimalu Srikanth, Charles J. Vath · Materials Research Bulletin · 2003 · 122 citations
Materials Science, Materials Engineering, Engineering +11
The Development of Cu Bonding Wire With Oxidation-Resistant Metal Coating
Shingo Kaimori, Takamasa Nonaka, Akira Mizoguchi · IEEE Transactions on Advanced Packaging · 2006 · 112 citations
Materials Science, Materials Engineering, Electrical Engineering +15
Development of copper wire bonding application technology
K. Toyozawa, Kazuya Fujita, S. Minamide et al. · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1990 · 105 citations
Materials Engineering, Materials Science, Electrical Engineering +13