Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS

Abstract

Higher density of integration and lower power technologies are becoming more sensitive to soft errors caused by radiations. Not only memories and latches are being affected but also combinatorial circuits. Hardening by design techniques based on increasing the amount of charge representing the bit and redundancy techniques have been used over the years. However, what happens if the hardening is affected? Who guards the guardians? This brief proposes a system that acts as a single-event transient (SET) filter and as a checkpoint with self-healing properties to prevent SET propagation. This is achieved due to feedback using bulk built-in current sensors.