IEEE Micro · 2006 · 121 citations · 8 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingFault-tolerant SystemsMicroelectronicsBuilt-in Self-testDigital Logic DesignError DetectionFault DetectionFault DiagnosisHardware Fault ToleranceCurrent SensorsError Detection CircuitsHardware Fault DetectionPower ConsumptionSequential Logic DesignSoft Error DetectionSoft Error MitigationSoft Errors
Connecting a built-in current sensor in the design bulk of a digital system increases sensitivity for detecting transient upsets in combinational and sequential logic. SPICE simulations validate this approach and show only minor penalties in terms of area, performance, and power consumption
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SEU-tolerant SRAM design based on current monitoring
Fabian Vargas, M. Nicolaidis · 2002 · 116 citations
Engineering, Computer Engineering, Electrical Engineering +17