Gilson Wirth

Atomistic approach to variability of bias-temperature instability in circuit simulations

B. Kaczer, Swaraj Bandhu Mahato, Vinícius Valduga de Almeida Camargo et al. · 2011 · 129 citations

Engineering, Computational Chemistry, Defect Tolerance +18

Using Bulk Built-in Current Sensors to Detect Soft Errors

Egas Henes Neto, Igor Daniel Alves Ribeiro, Michele O. Vieira et al. · IEEE Micro · 2006 · 120 citations · Full text

Engineering, Measurement, Analog Design +19

Statistical Model for MOSFET Bias Temperature Instability Component Due to Charge Trapping

Gilson Wirth, Roberto da Silva, B. Kaczer · IEEE Transactions on Electron Devices · 2011 · 87 citations

Device Modeling, Electrical Engineering, Charge Trapping +11

Modeling of Statistical Low-Frequency Noise of Deep-Submicrometer MOSFETs

Gilson Wirth, J. Koh, R. Thewes et al. · IEEE Transactions on Electron Devices · 2005 · 87 citations · Full text

Compact Modeling of Statistical BTI Under Trapping/Detrapping

Jyothi Velamala, Ketul B. Sutaria, Hirofumi Shimizu et al. · IEEE Transactions on Electron Devices · 2013 · 78 citations

Engineering, Cmos Design, Power Electronic Systems +19