Gilson Wirth - Concepedia

Author

Gilson Wirth

Universidade Federal do Rio Grande do Sul ORCID

Also Known As

G Wirth, G. I. Wirth, G. WIRTH, G. Wirth, G.I. Wirth, Gilson I Wirth, Gilson I. Wirth, Gilson Inacio Wirth, Gilson Incio Wirth, Gilson Inácio Wirth

227

Publications

2.2K

Citations

H-Index

Concepts

All Affiliations

Universidade Federal do Rio Grande do Sul Universidade Estadual do Rio Grande do Sul Arizona State University IMEC Paderborn University

About

Gilson Wirth is an author at Universidade Federal do Rio Grande do Sul specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	22	49	1.5K
2	Applied Physics	14	19	624
3	Education	4	4	180
4	Medicine	1	1	15
5	Natural Sciences	1	1	13

Gilson Wirth

Publications

1.8K

Citations

H-Index

Page 1

	Year	Citations
Atomistic approach to variability of bias-temperature instability in circuit simulations B. Kaczer, Swaraj Bandhu Mahato, Vinícius Valduga de Almeida Camargo, EngineeringComputational ChemistryDefect ToleranceReliability EngineeringAtomistic Approach	2011	129
Using Bulk Built-in Current Sensors to Detect Soft Errors Egas Henes Neto, Igor Daniel Alves Ribeiro, Michele O. Vieira, IEEE Micro EngineeringMeasurementAnalog DesignComputer ArchitectureEducation	2006	120
Statistical Model for MOSFET Bias Temperature Instability Component Due to Charge Trapping Gilson Wirth, Roberto da Silva, B. Kaczer IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringCharge TrappingEngineeringPhysics	2011	87
Modeling of Statistical Low-Frequency Noise of Deep-Submicrometer MOSFETs Gilson Wirth, J. Koh, R. Thewes, IEEE Transactions on Electron Devices	2005	87
Compact Modeling of Statistical BTI Under Trapping/Detrapping Jyothi Velamala, Ketul B. Sutaria, Hirofumi Shimizu, IEEE Transactions on Electron Devices EngineeringCmos DesignPower Electronic SystemsReliability EngineeringLongevity	2013	78
Single Event Transients in Logic Circuits—Load and Propagation Induced Pulse Broadening Gilson Wirth, Fernanda Lima Kastensmidt, Ivandro Ribeiro IEEE Transactions on Nuclear Science Hardware SecurityLogic Circuits—loadElectrical EngineeringSingle Event TransientsEngineering	2008	78
Response of a single trap to AC negative Bias Temperature stress M. Toledano-Luque, B. Kaczer, Ph. Roussel, Electrical EngineeringEngineeringStress-induced Leakage CurrentBias Temperature InstabilityApplied Physics	2011	71
Sub 1 V CMOS bandgap reference design techniques: a survey Christian Fayomi, Gilson Wirth, Hervé Facpong Achigui, Analog Integrated Circuits and Signal Processing Low-power ElectronicsElectrical EngineeringEngineeringVlsi DesignCircuit System	2009	63
Accurate and computer efficient modelling of single event transients in CMOS circuits Gilson Wirth, Michele G. Vieira, Fernanda Lima Kastensmidt IET Circuits Devices & Systems EngineeringVlsi DesignComputer ArchitectureCmos CircuitsComputer Efficient Modelling	2007	54
ZnO nanoparticle thin-film transistors on flexible substrate using spray-coating technique Fábio Fedrizzi Vidor, Thorsten Meyers, Gilson Wirth, Microelectronic Engineering Materials ScienceEngineeringFlexible ElectronicsNanotechnologySpray-coating Technique	2016	43

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