Current and Future Challenges in Radiation Effects on CMOS Electronics

TLDR

Advances in microelectronics performance and density are driven by Moore's law, yet recent developments in advanced technologies introduce new challenges and opportunities for radiation environments, with many CMOS technologies improving total dose tolerance while single‑event effects remain a serious concern for highly scaled devices. This paper examines the impact of these recent developments on the radiation effects community, covering how technology scaling affects radiation response and the challenges for both total dose and single‑event effects, and discusses future challenges as the industry looks beyond Moore's law. The authors discuss hardening and mitigation challenges at the nanometer scale, review recent developments that threaten hardness assurance, and outline future radiation‑effects challenges as the electronics industry moves beyond traditional CMOS technologies.

Abstract

Advances in microelectronics performance and density continue to be fueled by the engine of Moore's law. Although lately this engine appears to be running out of steam, recent developments in advanced technologies have brought about a number of challenges and opportunities for their use in radiation environments. For example, while many advanced CMOS technologies have generally shown improving total dose tolerance, single-event effects continue to be a serious concern for highly scaled technologies. In this paper, we examine the impact of recent developments and the challenges they present to the radiation effects community. Topics covered include the impact of technology scaling on radiation response and technology challenges for both total dose and single-event effects. We include challenges for hardening and mitigation techniques at the nanometer scale. Recent developments leading to hardness assurance challenges are covered. Finally, we discuss future radiation effects challenges as the electronics industry looks beyond Moore's law to alternatives to traditional CMOS technologies.