Microelectronics Reliability · 2011 · 32 citations · 21 references
EngineeringComputer EngineeringElectrical EngineeringMemoryMicroelectronicsSemiconductor DevicesDevice ModelingDevice SimulationIntegrated Circuit DesignMemory DevicesMemory ModelingMemory Subsystem DesignFlash MemoryFlash Memory DevicesLine Edge Roughness AnalysisLine RoughnessLine-edge RoughnessNand Flash MemoryNon-volatile Memory Design
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A 70 nm 16 Gb 16-Level-Cell NAND flash Memory
Noboru Shibata, K. Isobe, K. Iwasa et al. · IEEE Journal of Solid-State Circuits · 2008 · 81 citations