Jan Van Houdt

High-k dielectrics for future generation memory devices (Invited Paper)

J. A. Kittl, Karl Opsomer, M. Popovici et al. · Microelectronic Engineering · 2009 · 250 citations

Natural Sciences, Materials Engineering, Materials Science +16

VARIOT: a novel multilayer tunnel barrier concept for low-voltage nonvolatile memory devices

B. Govoreanu, Pieter Blomme, M. Rosmeulen et al. · IEEE Electron Device Letters · 2003 · 182 citations

Engineering, Computer Engineering, Electrical Engineering +17

Vertical Ferroelectric HfO<inf>2</inf> FET based on 3-D NAND Architecture: Towards Dense Low-Power Memory

Karine Florent, A. Subirats, Kaustuv Banerjee et al. · 2018 · 155 citations

Engineering, Computer Engineering, Electrical Engineering +16

Trap Spectroscopy by Charge Injection and Sensing (TSCIS): A quantitative electrical technique for studying defects in dielectric stacks

R. Degraeve, M. Cho, B. Govoreanu et al. · 2008 · 97 citations

Natural Sciences, Materials Science, Physics +17

Understanding ferroelectric Al:HfO2 thin films with Si-based electrodes for 3D applications

Karine Florent, Simone Lavizzari, M. Popovici et al. · Journal of Applied Physics · 2017 · 81 citations

Engineering, Electrical Engineering, Materials Science +17