Statistics
Publications
31
Citations
847
H-Index
17
Active since
2003
Pieter Blomme is an author at IMEC specializing in electrical engineering, microelectronics, and engineering.
Publications per year
2003–2019
31
31
Stress polarity dependence of degradation and breakdown of SiO/sub 2//high-k stacks
R. Degrave, T. Kauerauf, A. Kerber et al. · 2003 · 42 citations
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