Pieter Blomme

VARIOT: a novel multilayer tunnel barrier concept for low-voltage nonvolatile memory devices

B. Govoreanu, Pieter Blomme, M. Rosmeulen et al. · IEEE Electron Device Letters · 2003 · 182 citations

Engineering, Computer Engineering, Electrical Engineering +17

Two-Pulse $C$–$V$ : A New Method for Characterizing Electron Traps in the Bulk of $ \hbox{SiO}_{2}/\hbox{high-}\kappa$ Dielectric Stacks

Weidong Zhang, B. Govoreanu, Xiu Zheng et al. · IEEE Electron Device Letters · 2008 · 58 citations

Natural Sciences, Materials Engineering, Materials Science +13

Highly Scaled Vertical Cylindrical SONOS Cell With Bilayer Polysilicon Channel for 3-D nand Flash Memory

G. Van den bosch, Gouri Sankar Kar, Pieter Blomme et al. · IEEE Electron Device Letters · 2011 · 46 citations

Engineering, Computer Engineering, Electrical Engineering +17

A model for tunneling current in multi-layer tunnel dielectrics

B. Govoreanu, Pieter Blomme, M. Rosmeulen et al. · Solid-State Electronics · 2003 · 42 citations

Natural Sciences, Electrical Engineering, Materials Science +9

Stress polarity dependence of degradation and breakdown of SiO/sub 2//high-k stacks

R. Degrave, T. Kauerauf, A. Kerber et al. · 2003 · 42 citations

Natural Sciences, Materials Engineering, Materials Science +17