Concepedia

A. Kerber

AK

Statistics

Publications

77

Citations

3.3K

H-Index

32

Active since

2002

Affiliations

GlobalFoundries (United States)(Current)

IBM (United States)

Infineon Technologies (Germany)

IBM Research - Thomas J. Watson Research Center

A. Kerber is an author at GlobalFoundries (United States) specializing in engineering, semiconductor devices, and microelectronics.

Publications per year

2002–2020

77

Publications

77

Origin of the threshold voltage instability in SiO<sub>2</sub>/HfO<sub>2</sub> dual layer gate dielectrics

A. Kerber, E. Cartier, L. Pantisano et al. · IEEE Electron Device Letters · 2003 · 360 citations

Engineering, Electrical Engineering, Materials Science +17

Reliability Challenges for CMOS Technology Qualifications With Hafnium Oxide/Titanium Nitride Gate Stacks

A. Kerber, E. Cartier · IEEE Transactions on Device and Materials Reliability · 2009 · 189 citations

Engineering, Electrical Engineering, Materials Science +17

Passivation and interface state density of SiO2/HfO2-based/polycrystalline-Si gate stacks

R. J. Carter, E. Cartier, A. Kerber et al. · Applied Physics Letters · 2003 · 119 citations

Engineering, Materials Engineering, Materials Science +17

On the thermal stability of atomic layer deposited TiN as gate electrode in MOS devices

Jörgen Westlinder, T. Schram, L. Pantisano et al. · IEEE Electron Device Letters · 2003 · 115 citations

Engineering, Electrical Engineering, Materials Science +17

Accurate model for time-dependent dielectric breakdown of high-k metal gate stacks

T. Nigam, A. Kerber, Peter Peumans · IEEE International Reliability Physics Symposium proceedings · 2009 · 114 citations

Engineering, Electrical Engineering, Materials Science +17

1–5 of 77