Concepedia

T. Nigam

TN

Statistics

Publications

38

Citations

1.8K

H-Index

25

Active since

1996

Affiliations

GlobalFoundries (United States)(Current)

IMEC

Advanced Micro Devices (United States)

GlobalFoundries (Germany)

IBM (United States)

T. Nigam is an author at GlobalFoundries (United States) specializing in engineering, semiconductor devices, and electrical engineering.

ORCID

Publications per year

1996–2021

38

Publications

38

Soft breakdown of ultra-thin gate oxide layers

Michel Depas, T. Nigam, Marc Heyns · IEEE Transactions on Electron Devices · 1996 · 323 citations

, , +17

Model for the current–voltage characteristics of ultrathin gate oxides after soft breakdown

Michel Houssa, T. Nigam, Paul Mertens et al. · Journal of Applied Physics · 1998 · 118 citations

, , +17

Accurate model for time-dependent dielectric breakdown of high-k metal gate stacks

T. Nigam, A. Kerber, Peter Peumans · IEEE International Reliability Physics Symposium proceedings · 2009 · 114 citations

, , +17

On the properties of the gate and substrate current after soft breakdown in ultrathin oxide layers

Felice Crupi, R. Degraeve, G. Groeseneken et al. · IEEE Transactions on Electron Devices · 1998 · 97 citations

, , +17

Soft breakdown in ultrathin gate oxides: Correlation with the percolation theory of nonlinear conductors

Michel Houssa, T. Nigam, Paul Mertens et al. · Applied Physics Letters · 1998 · 92 citations

, , +17

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