G. Van den bosch - Concepedia

Author

G. Van den bosch

Also Known As

A. Furnémont, G Van den Bosch, G. Bosch, G. Bösch, G. Van Den Bosch, G. Van den Bosch, G. Van den bosch, G. van den Bosch, G. van den bosch, Geert Van Den Bosch

230

Publications

2.7K

Citations

H-Index

Concepts

All Affiliations

IMEC KU Leuven Liverpool John Moores University

About

G. Van den bosch is an author at IMEC specializing in engineering, electrical engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	25	78	2.1K
2	Applied Physics	23	62	1.5K
3	Natural Sciences	3	3	67
4	Education	1	1	11
5	Medicine	1	1	12

G. Van den bosch

Publications

2.2K

Citations

H-Index

Page 1

	Year	Citations
Spectroscopic charge pumping: A new procedure for measuring interface trap distributions on MOS transistors G. Van den bosch, G. Groeseneken, Paul Heremans, IEEE Transactions on Electron Devices Device ModelingSemiconductorsElectrical EngineeringEngineeringPhysics	1991	120
Characterization of Total Safe Operating Area of Lateral DMOS Transistors P. Moens, G. Van den bosch IEEE Transactions on Device and Materials Reliability Device ModelingElectrical Engineering40-V LdmosEngineeringAdvanced Packaging (Semiconductors)	2006	110
Temperature dependence of the channel hot-carrier degradation of n-channel MOSFET's Paul Heremans, G. Van den bosch, R. Bellens, IEEE Transactions on Electron Devices SemiconductorsDevice ModelingElectrical EngineeringSemiconductor TechnologyEngineering	1990	101
On the geometric component of charge-pumping current in MOSFETs G. Van den bosch, G. Groeseneken, H.E. Maes IEEE Electron Device Letters Device ModelingElectrical EngineeringNearby JunctionEngineeringGeometric Components	1993	84
Hot carrier degradation and time-dependent dielectric breakdown in oxides G. Groeseneken, R. Degraeve, T. Nigam, Microelectronic Engineering Electrical EngineeringEngineeringHot Carrier DegradationBias Temperature InstabilityApplied Physics	1999	67
Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions G. Groeseneken, R. Bellens, G. Van den bosch, Semiconductor Science and Technology Device ModelingElectrical EngineeringHot-carrier DegradationEngineeringDynamic Degradation	1995	66
Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices Alessandro Maconi, A. Arreghini, Christian Monzio Compagnoni, Solid-State Electronics Electrical EngineeringSemiconductor DeviceEngineeringAdvanced Packaging (Semiconductors)Nanoelectronics	2012	53
Highly Scaled Vertical Cylindrical SONOS Cell With Bilayer Polysilicon Channel for 3-D nand Flash Memory G. Van den bosch, Gouri Sankar Kar, Pieter Blomme, IEEE Electron Device Letters Non-volatile MemoryEngineeringEmerging Memory TechnologyIntegrated Circuits3D Memory	2011	45
Electrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Metal–Ferroelectric–Metal Capacitors A. Walke, M. Popovici, Kaustuv Banerjee, IEEE Transactions on Electron Devices Materials ScienceMaterials EngineeringElectrical EngineeringMultiferroicsEngineering	2022	45
On the hot-carrier-induced post-stress interface trap generation in n-channel MOS transistors R. Bellens, E. de Schrijver, G. Van den bosch, IEEE Transactions on Electron Devices Semiconductor TechnologyElectrical EngineeringDynamic Stress ConditionsHot-carrier StressEngineering	1994	43

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