Hot carrier degradation and time-dependent dielectric breakdown in oxides - Concepedia

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Hot carrier degradation and time-dependent dielectric breakdown in oxides

67

Citations

49

References

1999

Year

G. Groeseneken, R. Degraeve, T. Nigam, G. Van den bosch, H.E. Maes

Microelectronic Engineering

Electrical EngineeringEngineeringHot Carrier DegradationBias Temperature InstabilityApplied PhysicsTime-dependent Dielectric BreakdownDevice ReliabilityElectrical Insulation

References

	Year	Citations

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