Microelectronics Journal · 2013 · 55 citations · 27 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingDevice SimulationMetal-oxide-semiconductor Field-effect TransistorsP-n JunctionsDevice EfficiencyEfficiencyEnergy Band GapGate Oxide Thickness EffectsMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingNumerical Device SimulationSub-threshold Operation
27
Zener tunneling in semiconductors
E. O. Kane · Journal of Physics and Chemistry of Solids · 1960 · 944 citations
Ramanathan Gandhi, Zhixian Chen, Navab Singh et al. · IEEE Electron Device Letters · 2011 · 331 citations