Japanese Journal of Applied Physics · 1993 · 11 citations · 37 references
EngineeringMaterials EngineeringMaterials ScienceMaterials ChemistrySemiconductor DevicesSpectroscopyDefects In Electronic MaterialsSemiconductor DefectsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsChemical EtchingChemical PassivationEtch ChemistryEtch-induced DefectsEtchingHydrogen PassivationReactive Ion EtchingSurface Defects Characterization
InP crystals were etched by reactive ion etching (RIE) with ethane and hydrogen (C 2 H 6 /H 2 ). Etched crystals and gas species were characterized by photoluminescence and mass spectroscopic measurements. Evaporation of phosphorus is induced by hydrogen, mainly originating from H 2 gas. Incorporation of C increases with the gas species of hydrocarbon having multiple bonds. Near-bandgap emission with intensities greater than before RIE, which shows the hydrogen passivation, and defect-complex-related emission bands at 1.06-1.07 eV enhanced by RIE were observed. The role of gas species and the identification of defects are discussed on the basis of the experimental results.
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E. W. Williams, W. Elder, M.G. Astles et al. · Journal of The Electrochemical Society · 1973 · 153 citations