Journal of Applied Physics · 1982 · 107 citations · 20 references
Natural SciencesMaterials SciencePhysicsMaterials PhysicsSemiconductor MaterialsSpectroscopyElectronic Band StructureOptical Properties Of SemiconductorsSemiconductor DefectsSemiconductor Device MaterialsSemiconductor PhysicsAnnealingDeep-level ImpuritiesDefect-related LuminescencePhotoluminescencePhotoluminescence SpectroscopySemiconductor CharacterizationThermal AnnealingThermal Annealing Effects
Deep level photoluminescence bands related to Mn and Fe in InP are investigated. In InP(Mn) a strong broad band peaking at 1.15 eV and with phonon structure at 1.184, 1.145, and 1.107 eV is observed. A broad band peaking at 1.10 eV with weak phonon structure at 1.135, 1.098, and 1.062 eV is observed in InP(Fe). Several undoped InP crystals also reveal a band identical to that seen in InP(Mn) suggesting that Mn may be an inadvertent impurity. In these undoped samples and also in InP(Cr) the intensity of this band is greatly enhanced after thermal annealing (750 °C), suggesting that Mn may be diffusing to the surface. Mn has been previously reported to behave in this way in GaAs. Other unidentified deep level photoluminescence features in undoped material are also observed at 0.765 and 1.284 eV. Fe is detected as an inadvertent impurity in some undoped samples from studying the Fe2+(5T2−5E) internal transition.
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E. W. Williams, W. Elder, M.G. Astles et al. · Journal of The Electrochemical Society · 1973 · 153 citations
Optical and ESR analysis of the Fe acceptor in InP
W. Koschel, U. Kaufmann, S. G. Bishop · Solid State Communications · 1977 · 92 citations
P. B. Klein, P. E. R. Nordquist, P. G. Siebenmann · Journal of Applied Physics · 1980 · 89 citations