Thermal damage in SiC Schottky diodes induced by SE heavy ions - Concepedia

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Thermal damage in SiC Schottky diodes induced by SE heavy ions

34

Citations

10

References

2014

Year

C. Abbate, G. Busatto, P. Cova, Nicola Delmonte, F. Giuliani, Francesco Iannuzzo, A. Sanseverino, F. Velardi

Microelectronics Reliability

Electrical EngineeringSic Schottky DiodesEngineeringIon ImplantationPhysicsApplied PhysicsThermal DamageSe Heavy IonsCarbide

References

	Year	Citations

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