Concepedia

Publication | Closed Access

Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT

DOI

57

Citations

11

References

2015

Year

C. Abbate, G. Busatto, Francesco Iannuzzo, S. Mattiazzo, A. Sanseverino, L. Silvestrin, D. Tedesco, F. Velardi
Microelectronics Reliability

References

YearCitations

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