A. Sanseverino - Concepedia

Author

A. Sanseverino

Università degli studi di Cassino e del Lazio Meridionale ORCID

Also Known As

A Sanseverino, A. SANSEVERINO, A. Sanseverino, Annunziata Sanseverino, Serenelli, L.

Publications

819

Citations

H-Index

Concepts

All Affiliations

Università degli studi di Cassino e del Lazio Meridionale University of Padua Istituto Nazionale di Fisica Nucleare, Sezione di Roma I University of Parma Istituto Nazionale di Fisica Nucleare, Sezione di Pavia

About

A. Sanseverino is an author at Università degli studi di Cassino e del Lazio Meridionale specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	25	676
2	Applied Physics	11	13	429
3	Computer Engineering	4	4	74
4	Education	2	2	36
5	Biostatistics	1	1	26

A. Sanseverino

Publications

696

Citations

H-Index

Page 1

	Year	Citations
Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation—Part I C. Abbate, G. Busatto, D. Tedesco, IEEE Transactions on Electron Devices Electrical EngineeringSemiconductor DeviceEngineeringNanoelectronicsStress-induced Leakage Current	2019	78
Gate Damages Induced in SiC Power MOSFETs During Heavy-Ion Irradiation—Part II C. Abbate, G. Busatto, D. Tedesco, IEEE Transactions on Electron Devices Electrical EngineeringIon ImplantationEngineeringSemiconductor DeviceNanoelectronics	2019	64
Analysis of Heavy Ion Irradiation Induced Thermal Damage in SiC Schottky Diodes C. Abbate, G. Busatto, P. Cova, IEEE Transactions on Nuclear Science SemiconductorsSemiconductor TechnologyElectrical EngineeringSic Schottky DiodesEngineering	2015	60
Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT C. Abbate, G. Busatto, Francesco Iannuzzo, Microelectronics Reliability Wide-bandgap SemiconductorElectrical EngineeringEngineeringPhysicsApplied Physics	2015	57
High Frequency, High Efficiency, and High Power Density GaN-Based LLC Resonant Converter: State-of-the-Art and Perspectives Seyed Abolfazl Mortazavizadeh, Simone Palazzo, Arturo Amendola, Applied Sciences Converter StructureElectrical EngineeringEngineeringPower DevicePower Devices	2021	35
Thermal damage in SiC Schottky diodes induced by SE heavy ions C. Abbate, G. Busatto, P. Cova, Microelectronics Reliability Electrical EngineeringSic Schottky DiodesEngineeringIon ImplantationPhysics	2014	34
Experimental and Numerical investigation about SEB/SEGR of Power MOSFET G. Busatto, A. Porzio, F. Velardi, Microelectronics Reliability Device ModelingElectrical EngineeringPower MosfetEngineeringBias Temperature Instability	2005	30
Failure mechanisms of enhancement mode GaN power HEMTs operated in short circuit C. Abbate, G. Busatto, A. Sanseverino, Microelectronics Reliability Electrical EngineeringEngineeringPower DevicePower Semiconductor DeviceGan Power Device	2019	27
An improved model for extraction of strongly spatial dependent lifetimes with the AC lifetime profiling technique Santolo Daliento, A. Sanseverino, P. Spirito IEEE Transactions on Electron Devices Improved ModelElectrical EngineeringReliability EngineeringEngineeringMeasurement	1999	26
Failure analysis of 650 V enhancement mode GaN HEMT after short circuit tests C. Abbate, G. Busatto, A. Sanseverino, Microelectronics Reliability Electrical EngineeringEngineeringShort Circuit TestsPower Semiconductor DeviceFailure Analysis	2018	23

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