2002 · 13 citations · 8 references
EngineeringComputer EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesCmos Circuit DesignDevice CharacterizationDevice ModelingDevice SimulationIntegrated Circuit DesignMixed-signal ModelingComputer-aided Design ModelsDevice VariabilityHigh PerformanceMetal-oxide-semiconductor Field-effect Transistor ModelingOn-chip Variation AnalysisPerformance VariabilityProcess Variation AnalysisProcess Variation Characterization
A practical statistical SPICE model has been developed for computer-aided design of high performance devices. This model accounts for both interdie and intra-die device variations, both of which contribute to statistical variations in chip performance. A new characterization method, ET-based SPICE modeling, is proposed in order to link the shift of E-tests (Electrical tests) to the SPICE input deck without additional measurements of I-V curves. Therefore, we can efficiently analyze the chip performance with respect to the process variations. The model is applied to a 2.0 V 1.6 GHz bandwidth DRAM which has 0.19 /spl mu/m triple-well, 4-poly, 2-metal CMOS process. The simulated chip performance variability agrees well with measured data.
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Transistor matching in analog CMOS applications
Marcel Pelgrom, Hans Tuinhout, M. Vertregt · 2002 · 306 citations