Process Variation Characterization

Process Variation Characterization is a systematic methodology within MEMS testing that identifies and quantifies deviations in fabrication parameters across production batches to assess their impact on device performance and reliability.

414

Publications

16.3K

Citations

1.5K

Authors

363

Institutions

Publications per year

2017–2026

Parents

Mems Testing

Publications

414

Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration

Keith Bowman, Steven G. Duvall, J.D. Meindl · IEEE Journal of Solid-State Circuits · 2002 · 747 citations

Engineering, Computer Engineering, Electrical Engineering +17

Modeling and analysis of manufacturing variations

Sani Nassif · 2002 · 432 citations

Engineering, Computer Engineering, Design +17

FreePDK: An Open-Source Variation-Aware Design Kit

James E. Stine, Ivan D. Castellanos, Michael Wood et al. · 2007 · 429 citations

Engineering, Computer Engineering, Digital Design +17

VARIUS: A Model of Process Variation and Resulting Timing Errors for Microarchitects

Smruti R. Sarangi, Brian Greskamp, Radu Teodorescu et al. · IEEE Transactions on Semiconductor Manufacturing · 2008 · 421 citations

Engineering, Computer Engineering, Computer Science +17

Process Technology Variation

Kelin J. Kuhn, M.D. Giles, D. Becher et al. · IEEE Transactions on Electron Devices · 2011 · 365 citations

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 414

Authors

1.5K

SN
Sani Nassif
IBM Research - Austin, United States
14 publications · 1.3K citations
14
h-index
DS
Duane S. Boning
Massachusetts Institute of Technology, United States
13 publications · 574 citations
12
h-index
KA
Kanak Agarwal
IBM Research - Austin, United States
9 publications · 585 citations
9
h-index
CJ
Costas J. Spanos
University of California, Berkeley, United States
7 publications · 193 citations
7
h-index
JX
Jinjun Xiong
IBM Research - Thomas J. Watson Research Center, United States
7 publications · 391 citations
7
h-index

1–5 of 1.5K

Institutions

363

1–8 of 363

Venues

IEEE Transactions on Semiconductor Manufacturing
27 publications · 1.6K citations
20
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
18 publications · 545 citations
14
h-index
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
22 publications · 426 citations
14
h-index
IEEE Transactions on Electron Devices
10 publications · 774 citations
10
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
10 publications · 391 citations
10
h-index

1–5