Mems Testing

MEMS Testing is a systematic evaluation process within microelectromechanical systems engineering that verifies the functional performance, reliability, and environmental robustness of MEMS devices under controlled laboratory conditions.

2.1K

Publications

75.3K

Citations

6.7K

Authors

1.3K

Institutions

Publications per year

2017–2026

385

Authors

6.7K

  1. AM
    Andrei M. Shkel

    University of California, Irvine, United States

    22 publications · 687 citations

    16

    h-index

  2. TW
    Thomas W. Kenny

    Stanford University, United States

    17 publications · 913 citations

    15

    h-index

  3. KN
    K. Najafi

    University of Michigan, United States

    16 publications · 896 citations

    14

    h-index

  4. GL
    Giacomo Langfelder

    Politecnico di Milano, Italy

    14 publications · 426 citations

    14

    h-index

  5. AA
    Alexander A. Trusov

    University of California, Irvine, United States

    13 publications · 426 citations

    12

    h-index

1–5 of 6.7K

Venues

  1. Sensors and Actuators A Physical

    167 publications · 7.7K citations

    50

    h-index

  2. Journal of Microelectromechanical Systems

    132 publications · 7.7K citations

    46

    h-index

  3. Journal of Micromechanics and Microengineering

    JMM · 127 publications · 4.9K citations

    40

    h-index

  4. 26

    h-index

  5. IEEE Sensors Journal

    45 publications · 1.3K citations

    22

    h-index

1–5