Young-Kwan Park

Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling

Won‐Seok Lee, Keun-Ho Lee, Jinkyu Park et al. · 2004 · 54 citations

Engineering, Electrical Engineering, Circuit Theory +16

Reliability Issues and Models of sub-90nm NAND Flash Memory Cells

Hong Yang, Hyunjae Kim, Sung-il Park et al. · 2006 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +17

Intrinsic fluctuations in Vertical NAND flash memories

E. Nowak, Jaeho Kim, HyeYoung Kwon et al. · 2012 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +17

A practical Si nanowire technology with nanowire-on-insulator structure for beyond 10nm logic technologies

Sung-Gi Hur, Jung-Gil Yang, Sang-Su Kim et al. · 2013 · 48 citations

Engineering, Electrical Engineering, Materials Science +17

Programming Characteristics of Phase Change Random Access Memory Using Phase Change Simulations

Young‐Tae Kim, Young-Nam Hwang, Keun‐Ho Lee et al. · Japanese Journal of Applied Physics · 2005 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +17