HAL (Le Centre pour la Communication Scientifique Directe) · 2011 · 11 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice ReliabilitySemiconductor Device MaterialsSemiconductor ReliabilityThermal ManagementThermal Properties Of MaterialsThermal Properties Of SemiconductorsAgeingAgeing EffectsRobustnessSchottky Barrier DiodesSilicon CarbideSilicon Carbide (Sic) MaterialsSilicon Carbide Power DevicesThermal Management Of Semiconductor Devices
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Christophe Raynaud, Dominique Tournier, Hervé Morel et al. · Diamond and Related Materials · 2009 · 103 citations · Full text