Stuck-at Fault Testing

Stuck-At Fault Testing is a fault detection method in Built-In Self-Test that identifies permanent faults in digital circuits by verifying whether a signal line is permanently stuck at a logical high or low value, deviating from its intended functionality.

459

Publications

17.3K

Citations

867

Authors

275

Institutions

Publications per year

2017–2026

Parents

Built-in Self-test

Publications

459

Test set compaction algorithms for combinational circuits

İlker Hamzaoğlu, J.H. Patel · 1998 · 432 citations · Full text

Engineering, Computer Engineering, Computer Science +14

Transition Fault Simulation

J.A. Waicukauski, Eric Lindbloom, Barry K. Rosen et al. · IEEE Design & Test of Computers · 1987 · 402 citations

Engineering, Computer Engineering, Electrical Engineering +16

COMPACTEST: A METHOD TO GENERATE COMPACT TEST SETS FOR COMBINATIONAL CIRCUITS

Irith Pomeranz, Lakshmi Reddy, S.M. Reddy · 2005 · 261 citations

Engineering, Computer Engineering, Computer Science +14

Broad-side delay test

J. Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 255 citations

Engineering, Computer Engineering, Computer Science +14

Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits

Seiji Kajihara, Irith Pomeranz, K. Kinoshita et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1995 · 223 citations

Engineering, Computer Engineering, Electrical Engineering +10

1–5 of 459

Authors

867

SR
S.M. Reddy
University of Iowa, United States
40 publications · 1.7K citations
21
h-index
IP
Irith Pomeranz
University of Iowa, United States
38 publications · 1.6K citations
20
h-index
EM
E.J. McCluskey
Stanford University, United States
19 publications · 851 citations
15
h-index
NK
Niraj K. Jha
Princeton University, United States
12 publications · 298 citations
12
h-index
VD
Vishwani D. Agrawal
AT&T (United States), United States
11 publications · 287 citations
11
h-index

1–5 of 867

Institutions

275

1–8 of 275

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
41 publications · 2.1K citations
25
h-index
IEEE Transactions on Computers
46 publications · 2K citations
25
h-index
IEEE Design & Test of Computers
15 publications · 1.2K citations
15
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
9 publications · 373 citations
9
h-index
International Test Conference
Conference · 8 publications · 325 citations
8
h-index

1–5