Statistics
Publications
37
Citations
1.6K
H-Index
22
Active since
1970
K. Kinoshita is an author at The University of Osaka specializing in engineering, computer engineering, and design for testability.
Publications per year
1970–2012
37
37
Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits
Seiji Kajihara, Irith Pomeranz, K. Kinoshita et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1995 · 223 citations
Engineering, Computer Engineering, Electrical Engineering +10
On low-capture-power test generation for scan testing
Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara et al. · 2005 · 165 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +17
Low-capture-power test generation for scan-based at-speed testing
Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima et al. · 2006 · 127 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +17
A New ATPG Method for Efficient Capture Power Reduction During Scan Testing
Xiaoqing Wen, Seiji Kajihara, Kohei Miyase et al. · 2006 · 91 citations · Full text
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