Concepedia

Interconnect Variation Analysis

Interconnect Variation Analysis is a systematic method within interconnect design that characterizes and quantifies the deviations in electrical and physical properties of interconnect structures due to manufacturing process fluctuations, environmental conditions, and material inconsistencies, enabling reliability and performance assessment under variable operating scenarios.

83

Publications

3.7K

Citations

246

Authors

72

Institutions

Publications per year

2017–2026

5

Parents

Publications

83

Modeling and analysis of manufacturing variations

Sani Nassif · 2002 · 432 citations

, , +17

Reducing Variation in Advanced Logic Technologies: Approaches to Process and Design for Manufacturability of Nanoscale CMOS

Kelin J. Kuhn · 2007 · 235 citations

, , +17

Rapid characterization and modeling of pattern-dependent variation in chemical-mechanical polishing

B.E. Stine, Dennis O. Ouma, R. Divecha et al. · IEEE Transactions on Semiconductor Manufacturing · 1998 · 139 citations

, , +16

Model order-reduction of RC(L) interconnect including variational analysis

Ying Liu, Lawrence T. Pileggi, Andrzej J. Strojwas · 1999 · 132 citations

, , +17

Impact of interconnect variations on the clock skew of a gigahertz microprocessor

Ying Liu, Sani Nassif, Lawrence T. Pileggi et al. · 2000 · 121 citations · Full text

, , +14

1–5 of 83

Authors

246

  1. DS
    Duane S. Boning

    Massachusetts Institute of Technology, United States

    10 publications · 500 citations

    10

    h-index

  2. SN
    Sani Nassif

    IBM Research - Austin, United States

    9 publications · 1K citations

    9

    h-index

  3. ON
    O.S. Nakagawa

    Hewlett-Packard (United States), United States

    5 publications · 239 citations

    5

    h-index

  4. FC
    Flavio Canavero

    Politecnico di Torino, Italy

    5 publications · 284 citations

    5

    h-index

  5. SO
    Soo‐Young Oh

    Samsung Medical Center, South Korea

    4 publications · 221 citations

    4

    h-index

1–5 of 246

Institutions

72

  1. Massachusetts Institute of Technology

    Cambridge, United States

    11 h-index

    34 publications

    1.8K citations

  2. IBM Research - Austin

    Austin, United States

    9 h-index

    13 publications

    1.1K citations

  3. Carnegie Mellon University

    Pittsburgh, United States

    8 h-index

    18 publications

    1.2K citations

  4. Hewlett-Packard (United States)

    Palo Alto, United States

    5 h-index

    16 publications

    699 citations

  5. Politecnico di Torino

    Turin, Italy

    5 h-index

    11 publications

    693 citations

  6. IMEC

    Leuven, Belgium

    4 h-index

    34 publications

    1K citations

  7. IBM (United States)

    Armonk, United States

    4 h-index

    7 publications

    262 citations

  8. University of California, Berkeley

    Berkeley, United States

    4 h-index

    8 publications

    178 citations

1–8 of 72

Venues

  1. IEEE Transactions on Electron Devices

    5 publications · 184 citations

    5

    h-index

  2. 4

    h-index

  3. 3

    h-index

  4. 3

    h-index

  5. Microelectronics Reliability

    2 publications · 63 citations

    2

    h-index

1–5