D. Singh

Self-heat reliability considerations on Intel's 22nm Tri-Gate technology

C. Prasad, Lei Jiang, D. Singh et al. · 2013 · 84 citations

Engineering, Computer Engineering, Electrical Engineering +17

A 7nm CMOS technology platform for mobile and high performance compute application

B. Jagannathan, Akihisa Ogino, D. Jaeger et al. · 2017 · 60 citations

Engineering, Computer Engineering, Electrical Engineering +14

Challenges and Opportunities for High Performance 32 nm CMOS Technology

J.W. Sleight, Isaac Lauer, O. Dokumaci et al. · 2006 · 48 citations

Engineering, Computer Engineering, Electrical Engineering +17

Device reliability metric for end-of-life performance optimization based on circuit level assessment

A. Kerber, P. Srinivasan, S. Cimino et al. · 2017 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +17

Strained ultrahigh performance fully depleted nMOSFETs with f/sub t/ of 330 GHz and sub-30-nm gate lengths

D. Singh, K.A. Jenkins, J.W. Sleight et al. · IEEE Electron Device Letters · 2006 · 22 citations

Engineering, Electrical Engineering, Materials Science +17