S. Cimino

Accelerated wear-out of ultra-thin gate oxides after irradiation

Andrea Cester, S. Cimino, A. Paccagnella et al. · IEEE Transactions on Nuclear Science · 2003 · 45 citations

Electrical Engineering, Engineering, Nanoelectronics +11

Towards barrier height modulation in HfO2/TiN by oxygen scavenging – Dielectric defects or metal induced gap states?

L. Pantisano, V. V. Afanas’ev, S. Cimino et al. · Microelectronic Engineering · 2011 · 41 citations

Materials Science, Oxide Heterostructures, Towards Barrier +8

TiN x / HfO 2 interface dipole induced by oxygen scavenging

V. V. Afanas’ev, A. Stesmans, L. Pantisano et al. · Applied Physics Letters · 2011 · 40 citations

Engineering, Oxidation Resistance, Chemistry +17

Collapse of MOSFET drain current after soft breakdown and its dependence on the transistor aspect ratio W/L

Andrea Cester, S. Cimino, A. Paccagnella et al. · 2003 · 30 citations

Device Modeling, Electrical Engineering, Ion Implantation +10

Device reliability metric for end-of-life performance optimization based on circuit level assessment

A. Kerber, P. Srinivasan, S. Cimino et al. · 2017 · 27 citations

Engineering, Computer Architecture, Circuit Level Assessment +16