G. Raskin

Optimisation of a thin epitaxial Si layer as Ge passivation layer to demonstrate deep sub-micron n- and p-FETs on Ge-On-Insulator substrates

Brice De Jaeger, Renaud Bonzom, Frederik Leys et al. · Microelectronic Engineering · 2005 · 96 citations

Electrical Engineering, Epitaxial Growth, Engineering +9

A Study of the Influence of Typical Wet Chemical Treatments on the Germanium Wafer Surface

Bart Onsia, Thierry Conard, Stefan De Gendt et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2005 · 81 citations

Engineering, Belgium 2, Chemistry +16

Active dopant characterization methodology for germanium

Trudo Clarysse, Pierre Eyben, Tom Janssens et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2006 · 31 citations

Materials Science, Ssrm Current-voltage Curves, Electrical Engineering +13

Grown-In Lattice Defects and Diffusion in Czochralski-Grown Germanium

Jan Vanhellemont, Olivier De Gryse, Steven Hens et al. · Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum · 2004 · 21 citations

Engineering, Physics, Grown-in Lattice Defects +5

The future of high-K on pure germanium and its importance for Ge CMOS

Marc Meuris, Annelies Delabie, Sven Van Elshocht et al. · Materials Science in Semiconductor Processing · 2004 · 18 citations

Electrical Engineering, Engineering, Rf Semiconductor +9