Concepedia

Author

Maximilien Glorieux

STMicroelectronics (France)ORCID

Also Known As

Glorieux, Maximilien, M. Glorieux, Maximilien Glorieux

31

Publications

405

Citations

12

H-Index

60

Concepts

All Affiliations

STMicroelectronics (France)Polytechnic University of TurinEuropean Space Research and Technology CentreAmplitude Technologies (France)Centre National de la Recherche Scientifique
MG

About

Maximilien Glorieux is an author at STMicroelectronics (France) specializing in electrical engineering, engineering, and computer engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

11

13

318

2

Computer Engineering

11

12

301

3

Applied Physics

7

7

226

4

Education

2

2

21

5

Medicine

1

1

71

Maximilien Glorieux

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17

Publications

368

Citations

12

H-Index

YearCitations

Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology

Rui Liu, Veronique Ferlet-Cavrois, Adrian Evans,

IEEE Transactions on Nuclear Science

2016

71

SER/SEL performances of SRAMs in UTBB FDSOI28 and comparisons with PDSOI and BULK counterparts

Gilles Gasiot, Dimitri Soussan, Maximilien Glorieux,

2014

47

Detailed SET Measurement and Characterization of a 65 nm Bulk Technology

Maximilien Glorieux, Adrian Evans, Véronique Ferlet-Cavrois,

IEEE Transactions on Nuclear Science

2016

33

New D-Flip-Flop Design in 65 nm CMOS for Improved SEU and Low Power Overhead at System Level

Maximilien Glorieux, Sylvain Clerc, Gilles Gasiot,

IEEE Transactions on Nuclear Science

2013

27

Single event multiple transient (SEMT) measurements in 65 nm bulk technology

Adrian Evans, Maximilien Glorieux, Dan Alexandrescu,

2016

24

Heavy ions test result on a 65nm Sparc-V8 radiation-hard microprocessor

Cyril Bottoni, Maximilien Glorieux, J.M. Daveau,

2014

20

Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits

Maximilien Glorieux, Jean‐Luc Autran, Daniela Munteanu,

IEEE Transactions on Nuclear Science

2014

19

Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

Rubén García Alía, Maris Tali, Markus Brugger,

IEEE Transactions on Nuclear Science

2019

17

Single-Event Characterization of Xilinx UltraScale+<sup>®</sup> MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation

Maximilien Glorieux, Adrian Evans, Thomas Lange,

2018

15

Experimental Soft Error Rate of Several Flip-Flop Designs Representative of Production Chip in 32 nm CMOS Technology

Gilles Gasiot, Maximilien Glorieux, Sylvain Clerc,

IEEE Transactions on Nuclear Science

2013

14

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