Publication | Closed Access
SER/SEL performances of SRAMs in UTBB FDSOI28 and comparisons with PDSOI and BULK counterparts
47
Citations
11
References
2014
Year
Unknown Venue
Electrical EngineeringEngineeringConsumer ApplicationsUtbb Fdsoi28Bulk CounterpartsSer/sel PerformancesApplied PhysicsNeutron SourceComputer EngineeringComputer ArchitectureIntrinsic Ser HardnessSemiconductor MemorySilicon On InsulatorMicroelectronicsNeutron ScatteringNuclear EngineeringNeutron Ser CharacterizationsMulti-channel Memory Architecture
This work presents alpha and neutron SER characterizations of a 28nm commercial Fully-Depleted SOI technology predisposed to consumer applications. Its intrinsic SER hardness is as well compared to known highly reliable Partially-Depleted SOI technologies.
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