Rui Liu

Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology

Rui Liu, Veronique Ferlet-Cavrois, Adrian Evans et al. · IEEE Transactions on Nuclear Science · 2016 · 71 citations

Engineering, Single Event Transient, Heavy Ion +21

A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience

Y.-Q. Li, Haibin Wang, Rui Liu et al. · IEEE Transactions on Nuclear Science · 2017 · 59 citations

Hardware Security, Low-power Electronics, Electrical Engineering +11

A 65 nm Temporally Hardened Flip-Flop Circuit

Y.-Q. Li, Haibin Wang, Rui Liu et al. · IEEE Transactions on Nuclear Science · 2016 · 27 citations

Engineering, Vlsi Design, Computer Architecture +16

Simulation of AC Loss in Small HTS Coils With Iron Core

Lingfeng Lai, Chen Gu, Timing Qu et al. · IEEE Transactions on Applied Superconductivity · 2014 · 25 citations

Electrical Engineering, Small Hts Coils, Engineering +9

A BiLSTM-CRF Method to Chinese Electronic Medical Record Named Entity Recognition

Bin Ji, Rui Liu, Shasha Li et al. · 2018 · 25 citations

Engineering, Word Vector, Text Mining +16