Veronique Ferlet-Cavrois

Single Event Transient and TID Study in 28 nm UTBB FDSOI Technology

Rui Liu, Veronique Ferlet-Cavrois, Adrian Evans et al. · IEEE Transactions on Nuclear Science · 2016 · 71 citations

Engineering, Single Event Transient, Heavy Ion +21

Transient Radiation Response of Single- and Multiple-Gate FD SOI Transistors

Marc Gaillardin, Philippe Paillet, Veronique Ferlet-Cavrois et al. · IEEE Transactions on Nuclear Science · 2007 · 31 citations

Semiconductor Technology, Electrical Engineering, Single Event Upset +13

Transient Response of Semiconductor Electronics to Ionizing Radiation. Recent Developments in Charge-Collection Measurement

Dale McMorrow, Veronique Ferlet-Cavrois, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2007 · 26 citations

Engineering, Charge-collection Measurements, Charge Transport +19

SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate

Rubén García Alía, E. W. Blackmore, Markus Brugger et al. · IEEE Transactions on Nuclear Science · 2014 · 24 citations

High-energy Electron Induced SEUs and Jovian Environment Impact

Maris Tali, Rubén García Alía, Markus Brugger et al. · IEEE Transactions on Nuclear Science · 2017 · 24 citations

Single Event Upset, Engineering, Radiation Detection +13