Y.-Q. Li

An SEU-Tolerant DICE Latch Design With Feedback Transistors

Haibin Wang, Y.-Q. Li, Li Chen et al. · IEEE Transactions on Nuclear Science · 2015 · 41 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +12

An Area Efficient SEU-Tolerant Latch Design

Haibin Wang, Jinshun Bi, Menglong Li et al. · IEEE Transactions on Nuclear Science · 2014 · 28 citations

Hardware Security, Low-power Electronics, Electrical Engineering +13

A 65 nm Temporally Hardened Flip-Flop Circuit

Y.-Q. Li, Haibin Wang, Rui Liu et al. · IEEE Transactions on Nuclear Science · 2016 · 27 citations

Engineering, Vlsi Design, Computer Architecture +16

An Area Efficient Stacked Latch Design Tolerant to SEU in 28 nm FDSOI Technology

Haibin Wang, Li Chen, R. Liu et al. · IEEE Transactions on Nuclear Science · 2016 · 25 citations

Engineering, Vlsi Design, Computer Architecture +18

Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology

Haibin Wang, N. N. Mahatme, Li Chen et al. · IEEE Transactions on Nuclear Science · 2016 · 21 citations

Hardware Security, Dff Chain, Electrical Engineering +14