Statistics
Publications
6
Citations
366
H-Index
6
Active since
2002
Affiliations
G. Hueckel is an author at IBM (United States) specializing in engineering, microelectronics, and device reliability.
Publications per year
2002–2003
6
6
Challenges for accurate reliability projections in the ultra-thin oxide regime
Ernest Y. Wu, W.W. Abadeer, Liang-Kai Han et al. · 2003 · 100 citations
Voltage-dependent voltage-acceleration of oxide breakdown for ultra-thin oxides
Ernest Y. Wu, J. Aitken, E. Nowak et al. · 2002 · 82 citations
A high reliability metal insulator metal capacitor for 0.18 μm copper technology
M. Armacost, A. Augustin, P. Felsner et al. · 2002 · 50 citations
A 200 mm SiGe-HBT technology for wireless and mixed-signal applications
D.L. Harame, K. Schonenberg, M. Gilbert et al. · 2002 · 32 citations
Engineering, Electrical Engineering, Manufacturing Engineering +17
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