W.W. Abadeer

Challenges for accurate reliability projections in the ultra-thin oxide regime

Ernest Y. Wu, W.W. Abadeer, Liang-Kai Han et al. · 2003 · 100 citations

Engineering, Materials Engineering, Materials Science +17

Behavior of NBTI under AC dynamic circuit conditions

W.W. Abadeer, W. Ellis · 2003 · 98 citations

Engineering, Electrical Engineering, Electronic Materials +16

Structural dependence of dielectric breakdown in ultra-thin gate oxides and its relationship to soft breakdown modes and device failure

Ernest Y. Wu, E. Nowak, J. Aitken et al. · 2002 · 85 citations

Engineering, Electrical Engineering, Materials Science +17

A Thin-Film SOI 180nm CMOS RF Switch Technology

A. Botula, Alvin Joseph, J. Slinkman et al. · 2009 · 84 citations

Engineering, Electrical Engineering, Microelectronics +16

Ultralow-power SRAM technology

R. Mann, W.W. Abadeer, M. Breitwisch et al. · IBM Journal of Research and Development · 2003 · 42 citations

Engineering, Computer Engineering, Electrical Engineering +8