F. Matsuoka

Future perspective and scaling down roadmap for RF CMOS

E. Morifuji, H.S. Momose, T. Ohguro et al. · 2003 · 94 citations

Electrical Engineering, Engineering, Vlsi Design +14

Supply and threshold-Voltage trends for scaled logic and SRAM MOSFETs

E. Morifuji, Takeshi Yoshida, M. Kanda et al. · IEEE Transactions on Electron Devices · 2006 · 81 citations

Low-power Electronics, Power Consumption, Electrical Engineering +14

Analysis of hot-carrier-induced degradation mode on pMOSFET's

F. Matsuoka, Hiroshi Iwai, H. Hayashida et al. · IEEE Transactions on Electron Devices · 1990 · 67 citations

Buried-channel Pmosfets, Electrical Engineering, Engineering +15

Analysis on gate-oxide thickness dependence of hot-carrier-induced degradation in thin-gate oxide nMOSFET's

Y. Toyoshima, Hiroshi Iwai, F. Matsuoka et al. · IEEE Transactions on Electron Devices · 1990 · 66 citations

Device Modeling, Gate-oxide Thickness Dependence, Electrical Engineering +12

Competitive and cost effective high-k based 28nm CMOS technology for low power applications

F. Arnaud, Aaron Thean, M. Eller et al. · 2009 · 43 citations

Low-power Electronics, Low Power Applications, Electrical Engineering +14