Hiroshi Iwai

On the scaling issues and high-κ replacement of ultrathin gate dielectrics for nanoscale MOS transistors

Hei Wong, Hiroshi Iwai · Microelectronic Engineering · 2006 · 365 citations

Engineering, Materials Engineering, Materials Science +17

1.5 nm direct-tunneling gate oxide Si MOSFET's

H. Sasaki, Mizuki Ono, T. Yoshitomi et al. · IEEE Transactions on Electron Devices · 1996 · 346 citations

Engineering, Electrical Engineering, Microelectronics +15

NiSi salicide technology for scaled CMOS

Hiroshi Iwai, T. Ohguro, Shun-ichiro Ohmi · Microelectronic Engineering · 2002 · 308 citations

Engineering, Mechatronics Engineering, Semiconductor Devices +7

Roadmap for 22nm and beyond (Invited Paper)

Hiroshi Iwai · Microelectronic Engineering · 2009 · 291 citations

Engineering, Computer Engineering, Electrical Engineering +12

Self-aligned nickel-mono-silicide technology for high-speed deep submicrometer logic CMOS ULSI

T. Morimoto, T. Ohguro, H.S. Momose et al. · IEEE Transactions on Electron Devices · 1995 · 275 citations

Engineering, Electrical Engineering, Materials Science +17