Thomas Detzel

A comparative micro-cantilever study of the mechanical behavior of silicon based passivation films

Kurt Matoy, Helmut Schönherr, Thomas Detzel et al. · Thin Solid Films · 2009 · 254 citations

Engineering, Flexible Electronics, Mechanical Behavior +11

Influence of Buffer Carbon Doping on Pulse and AC Behavior of Insulated-Gate Field-Plated Power AlGaN/GaN HEMTs

G. Verzellesi, Luca Morassi, Gaudenzio Meneghesso et al. · IEEE Electron Device Letters · 2014 · 113 citations · Full text

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +13

Interface fracture properties of thin films studied by using the micro-cantilever deflection technique

Kurt Matoy, Thomas Detzel, Matthias Müller et al. · Surface and Coatings Technology · 2009 · 80 citations

Materials Science, Engineering, Microfabrication +13

Degradation Mechanisms of GaN HEMTs With p-Type Gate Under Forward Gate Bias Overstress

Maria Ruzzarin, Matteo Meneghini, A. Barbato et al. · IEEE Transactions on Electron Devices · 2018 · 73 citations · Full text

Semiconductor Technology, Wide-bandgap Semiconductor, Electrical Engineering +9

Stress, Sheet Resistance, and Microstructure Evolution of Electroplated Cu Films During Self-Annealing

Rui Huang, W. Robl, H. Ceric et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 63 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +18