A. Barbato

Degradation Mechanisms of GaN HEMTs With p-Type Gate Under Forward Gate Bias Overstress

Maria Ruzzarin, Matteo Meneghini, A. Barbato et al. · IEEE Transactions on Electron Devices · 2018 · 73 citations · Full text

Semiconductor Technology, Wide-bandgap Semiconductor, Electrical Engineering +9

Potential induced degradation of N-type bifacial silicon solar cells: An investigation based on electrical and optical measurements

Marco Barbato, A. Barbato, Matteo Meneghini et al. · Solar Energy Materials and Solar Cells · 2017 · 38 citations

Materials Science, Electrical Engineering, Engineering +6

Effect of PVOH/PLA + Wax Coatings on Physical and Functional Properties of Biodegradable Food Packaging Films

Annalisa Apicella, A. Barbato, Emilia Garofalo et al. · Polymers · 2022 · 34 citations · Full text

High-Barrier, Biodegradable Films with Polyvinyl Alcohol/Polylactic Acid + Wax Double Coatings: Influence of Relative Humidity on Transport Properties and Suitability for Modified Atmosphere Packaging Applications

A. Barbato, Annalisa Apicella, Francesca Malvano et al. · Polymers · 2023 · 28 citations · Full text

ESD-failure of E-mode GaN HEMTs: Role of device geometry and charge trapping

E. Canato, Matteo Meneghini, A. Nardo et al. · Microelectronics Reliability · 2019 · 18 citations · Full text