E. Canato

Reliability and failure analysis in power GaN-HEMTs: An overview

Matteo Meneghini, Isabella Rossetto, Carlo De Santi et al. · 2017 · 106 citations

Reliability, Electrical Engineering, Engineering +10

On the origin of the leakage current in p-gate AlGaN/GaN HEMTs

A. Stockman, E. Canato, Alaleh Tajalli et al. · 2018 · 57 citations

Wide-bandgap Semiconductor, Electrical Engineering, Temperature Dependent Dc +10

Threshold Voltage Instability Mechanisms in p-GaN Gate AlGaN/GaN HEMTs

A. Stockman, E. Canato, Matteo Meneghini et al. · 2019 · 54 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +8

Positive temperature dependence of time-dependent breakdown of GaN-on-Si E-mode HEMTs under positive gate stress

F. Masin, Matteo Meneghini, E. Canato et al. · Applied Physics Letters · 2019 · 45 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +13

Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs

A. Stockman, E. Canato, Matteo Meneghini et al. · IEEE Transactions on Device and Materials Reliability · 2021 · 45 citations

Wide-bandgap Semiconductor, Electrical Engineering, Threshold Voltage Stability +10