An investigation of angle effect on heavy ion induced single event effect in SiC MOSFET

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The Near-Earth Space Radiation Environment

S. Bourdarie, M.A. Xapsos · IEEE Transactions on Nuclear Science · 2008 · 231 citations · Full text

Natural Sciences, Aerospace Engineering, Physics +16

Single-Event Burnout Mechanisms in SiC Power MOSFETs

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An Updated Perspective of Single Event Gate Rupture and Single Event Burnout in Power MOSFETs

Jeffrey L. Titus · IEEE Transactions on Nuclear Science · 2013 · 153 citations

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Ion-Induced Energy Pulse Mechanism for Single-Event Burnout in High-Voltage SiC Power MOSFETs and Junction Barrier Schottky Diodes

Dennis R. Ball, John M. Hutson, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2019 · 133 citations

Engineering, Electrical Engineering, Physics +17