M.A. Xapsos - Concepedia

Author

M.A. Xapsos

United States Naval Research Laboratory ORCID

Also Known As

M. A Xapsos, M. A. Xapsos, M. Xapsos, M.A. Xapsos, Michael A Xapsos, Michael A. Xapsos, Michael Xapsos, Xapsos, M. A., Xapsos, Michael, Xapsos, Michael A.

142

Publications

Citations

H-Index

137

Concepts

All Affiliations

United States Naval Research Laboratory Goddard Space Flight Center MEI Technologies (United States)Schiller International University University of Maryland, Baltimore County

About

M.A. Xapsos is an author at United States Naval Research Laboratory specializing in engineering, physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	28	58	3.4K
2	Natural Sciences	14	18	1.1K
3	Medicine	9	9	132
4	Health Sciences	3	3	121
5	Social Sciences	1	1	12

M.A. Xapsos

Publications

3.7K

Citations

H-Index

Page 1

	Year	Citations
Modeling solar cell degradation in space: A comparison of the NRL displacement damage dose and the JPL equivalent fluence approaches† Scott R. Messenger, G.P. Summers, E.A. Burke, Progress in Photovoltaics Research and Applications EngineeringSpace EnvironmentEnergy EfficiencyRadiation ExposureDisplacement Damage Dose	2001	285
The Near-Earth Space Radiation Environment S. Bourdarie, M.A. Xapsos IEEE Transactions on Nuclear Science EngineeringSpace EnvironmentSolar Terrestrial EnvironmentAerospace EngineeringSpace Radiation Environment	2008	225
Nonionizing energy loss (NIEL) for heavy ions S.R. Messenger, E.A. Burke, G.P. Summers, IEEE Transactions on Nuclear Science Electrical EngineeringIon ImplantationEngineeringHeavy Ion PhysicPhysics	1999	221
Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed, IEEE Transactions on Nuclear Science Rate PredictionsLow Energy ProtonsElectrical EngineeringHeavy Ion PhysicEngineering	2009	191
Proton nonionizing energy loss (NIEL) for device applications Insoo Jun, M.A. Xapsos, Scott R. Messenger, IEEE Transactions on Nuclear Science Low-power ElectronicsElectrical EngineeringEnergy HarvestingEngineeringNuclear Physics	2003	180
Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM David F. Heidel, Paul W. Marshall, Jonathan A. Pellish, IEEE Transactions on Nuclear Science Hardware SecurityElectrical EngineeringEngineeringVlsi DesignPhysics	2009	162
Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM David F. Heidel, Paul W. Marshall, Kenneth A. LaBel, IEEE Transactions on Nuclear Science Hardware SecurityExperimental ResultsElectrical EngineeringEngineeringPhysics	2008	156
Probability model for cumulative solar proton event fluences M.A. Xapsos, G.P. Summers, J.L. Barth, IEEE Transactions on Nuclear Science Expected Total FluenceSolar VariabilityEngineeringData ScienceSolar Energetic Particle	2000	134
Probability model for worst case solar proton event fluences M.A. Xapsos, G.P. Summers, J.L. Barth, IEEE Transactions on Nuclear Science Solar VariabilityEngineeringHigh-energy Nuclear ReactionPower LawNatural Sciences	1999	106
Displacement damage analogs to ionizing radiation effects G.P. Summers, E.A. Burke, M.A. Xapsos Radiation Measurements PhysicsRadiation EffectIonizing RadiationRadiation ExposureDisplacement Damage Analogs	1995	104

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