Proton nonionizing energy loss (NIEL) for device applications

Abstract

The proton-induced nonionizing energy loss (NIEL) for representative device materials are presented for the energy range between the displacement damage threshold to 1 GeV. All interaction mechanisms (Coulomb and nuclear elastic/nonelastic) are fully accounted for in the present NIEL calculations. For Coulomb interactions, the Ziegler-Biersack-Littmark (ZBL) screened potential was used in the lower energy range (<50 MeV) and the relativistic formulation was used in the higher energy range (/spl ges/50 MeV). A charged particle transport code, MCNPX, was used to compute the NIEL due to nuclear interactions.