Microelectronics Journal · 2021 · 13 citations · 49 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsNanotechnologySemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationDevice ModelingIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsThin-film TransistorsDigital Logic CircuitsGate DielectricsGate LeakageLeakageLeakage Current ReductionOvershootSignal Propagation DelayTiming Performance Metrics
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Tunnel field-effect transistor without gate-drain overlap
Anne S. Verhulst, William G. Vandenberghe, Karen Maex et al. · Applied Physics Letters · 2007 · 432 citations · Full text