2019 · 11 citations · 5 references
EngineeringElectrical EngineeringManufacturing EngineeringMicroelectronicsMicrofabricationSemiconductor DevicesDevice ModelingDevice ScalingElectron Beam LithographyIntegrated Circuit DesignIntegrated Circuit FabricationDeep Ultraviolet LithographyExtreme Ultraviolet LithographyManufacturingMicro-metrologyMoore's Law ScalingScaling Cost AnalysisSemiconductor TechnologyTechnology Scaling
Our efforts to uphold Moore's Law include continued enhancements of system performance and the development of high-numerical-aperture (0.55 NA) EUVL systems. They also include constant innovations in well-established deep-UV lithography systems that have been driving down cost of ownership and have supported the manufacturing of new device architectures e.g. 3D memories. Full potential of lithography - its ultimate capability when used in manufacturing - is realized by making exposure systems, metrology tools, and computational algorithms work together synergistically. It is our belief that continued advances in this holistic lithography will enable cost-effective scaling in semiconductor device manufacturing beyond the next decade.
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Alternative reticles for low-k1 EUV imaging
Claire van Lare, Frank Timmermans, Jo Finders · 2019 · 31 citations