International Electron Devices Meeting

Progress in Digital Integrated Electronics

Gordon E. Moore · 1975 · 750 citations

Engineering, Computer Engineering, Electrical Engineering +12

Proceedings of the 2012 IEEE International Electron Devices Meeting (IEDM)

Subir Parui, Kumari Gaurav Rana, T. Banerjee · 2012 · 199 citations

Engineering, Electrical Engineering, Physics +12

Doping of n+ and p+ polysilicon in a dual-gate CMOS process

C. Y. Wong, J.Y.-C. Sun, Yuan Taur et al. · 1988 · 58 citations

Engineering, Electrical Engineering, Materials Science +14

N-channel IGFET design limitations due to hot electron trapping

Sura Adil Abbas · 1975 · 50 citations

Engineering, Computer Engineering, Electrical Engineering +12

Steady-state analysis of field effect transistors via the finite element method

P.E. Cottrell, E. M. Buturla · 1975 · 44 citations

Engineering, Electrical Engineering, Finite Element Analysis +12