Publication | Closed Access
First performance results of the ASML alpha demo tool
78
Citations
6
References
2006
Year
Performance BenchmarkingShort Wavelength OpticEngineeringElectron-beam LithographyDemo ToolSoftware EngineeringIntegrated CircuitsSoftware AnalysisBeam LithographyFunctional Lithography ToolParallel ComputingInstrumentationOptical SystemsPhotonicsFirst Performance ResultsComputer EngineeringComputer SciencePerformance Analysis ToolBenchmarking ToolAlpha Demo ToolMicrofabricationProgram AnalysisSoftware TestingApplied PhysicsParallel ProgrammingOptoelectronicsSystem Software
The ASML EUV alpha demo tool is operational! The alpha demo tool is a 0.25NA fully functional lithography tool with a field size of 26×33 mm<sup>2</sup>, enabling process development at the 40-nm technology node. In this paper we describe the tool performance, show that vacuum is achieved in a few hours, and demonstrate that our optics contamination strategy mitigates degradation of the optics. Additional data shows the Sn source cost-of-ownership to be comparable to state-of-the-art ArF source systems, by implementing a collector contamination mitigation strategy that includes cleaning. And, we present our first 35-nm dense lines and spaces (half pitch) resist images.
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